We would like to present two product examples that impressively meet test requirements under high currents, such as the 1075/GV high-current test probe. Moreover, the HSK 5455 high-current probe combines compact design and vibration resistance with reliable test results for a continous current of up to 400 A.
Scratch-free contact under high currents
The new high-current test probe 1075/GV is ideally suited for the secure contacting of tab connectors through the unique tip style.
The safe contacting of tab connectors with high currents is a special challenge in test engineering. Flat blade connectors are increasingly used in end-of-line testing, especially in the field of eMobility and, for example, in automotive infotainment.
The contact surfaces on the front are usually too small to transmit high currents reliably. At the same time, the test must not leave any traces on the contact surfaces. The contact pin guarantees a scratch-free contact for high currents of up to 50 A. The non-rotating design of the contact pin allows ideal and permanently secure alignment with the Device under test. When the contact head is guided over the flat tab, the movable part of the head presses the flat pin against the immovable part. In this way, a large-area contact is ensured without impairing the contact surfaces of the DUT.
New high-current test probe for 400 A
Motor-vehicle manufacturers and subsuppliers set high standards for the contacting incorporated into their test systems. The demands made have, in fact, risen steeply in recent years, particularly in the field of e-mobility. The currents to be tested can, for example, quickly exceed 300 A in the case of battery cells and inverters. In addition, vibration and transverse forces can occur during testing or in the energy supply during production.
For such conditions, PTR HARTMANN GmbH has now augmented its extensive range of high-current test probes with the new HSK 5455. The HSK 5455 is designed for a continuous current of up to 400 A and for use in “end-of-line” (EOL) / function testing.
The contact pin is just as ideally suitable for contacting of arresters on pouch and prismatic battery cells, battery modules and battery packs as for contacting of busbars. Despite its compact dimensions, this contact unit is suitable for use in adverse production conditions – transverse forces and vibration cause no problems, nor do uneven contact surfaces. The probe tip is equipped with thirty separately sprung contact pins, assuring extraordinary certainty of contact. This function is supported by the special design of the probe tip, which balances out axial tolerances with a deflection of up to 3.0°.
The very low contact resistance of ≤ 0.2 mΩ ensures that the voltage drop occurring during testing is kept as low as possible.
This is achieved via the use of a continuous plunger, of a large number of highly conductive and readily-contacting probe plungers consisting of a silver alloy, via the use of high-conductivity copper alloys as the base materials and via coating with a tarnish-resistant and abrasion-proof silver alloy.
For quick connection and disconnection, the electrical link at the end of the contact can be made by fitting a cable lug. We recommend the use of a highly flexible conductor for connection, in order not to obstruct movement, since deflection of the probe tip also causes the connecting area to move.
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